Zeiss
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The Zeiss Sigma 300 SEM is a field emission scanning electron microscope. The Zeiss Sigma 300 SEM offers superior low-kV performance approaching 1.5 nm at 1 kV. The Zeiss Sigma 300 SEM includes a 5-axis motorized eucentric specimen stage.[1]

The Zeiss Sigma 300 SEM is a field emission scanning electron microscope (FE-SEM). The instrument offers a low-kV performance approaching 1.5 nm at 1 kV. The microscope is located in the lower level cleanroom of MIT.nano.[1]
The Zeiss Sigma 300 SEM features a 5-axis motorized eucentric specimen stage with X and Y travel of 130 mm, Z travel of 50 mm, tilt range of -3° to 70°, and 360° rotation. The instrument is equipped with an Everhart–Thornley secondary electron detector and an in-lens secondary electron detector. The probe current ranges from 3 pA to 20 nA.[1]
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Sigma 300 VP | — | — | — | manualslib.com[3] |
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The following facts about the Sigma 300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Sigma 300 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Sigma 300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Sigma 300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Sigma 300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Sigma 300 are on record.
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Last updated Oct 7, 2026.
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