Waferpedia

Tool family

Zeiss Sigma 300

Models in this family

  1. The Zeiss Sigma 300 is a field emission scanning electron microscope used for SEM imaging and related metrology and inspection workflows.

    Cited variants

    DesignationGenerationVintageChangesSource
    Sigma 300 VP———manualslib.com[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]manualslib.commanualslib.com