Ulvac
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An ICP-RIE etcher uses a plasma source to generate reactive species and a biased wafer stage to direct ion-assisted material removal.
The Ulvac NE 950 sits in the etch segment of semiconductor manufacturing, where patterned material is removed after lithographic pattern transfer.
An ICP-RIE tool is used after pattern definition and before later cleaning, deposition, or metrology steps that follow etched feature formation.
The Ulvac NE 950 is used for plasma etching of semiconductor materials where directional material removal is needed.
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Uniformity is controlled by the reactor design—such as gas distribution via a showerhead electrode, temperature control of the wafer chuck, and plasma confinement—as well as by adjusting RF power, pressure, and gas flow rates. Endpoint detection (e.g., optical emission spectroscopy) helps stop the etch at the correct layer.
Challenges include microloading (etch rate variation with pattern density), notching (undercutting at feature corners), and plasma damage to sensitive devices. Particle contamination from reactor walls or residues can also occur. Regular maintenance and chamber conditioning help mitigate these issues.
Some dry etch processes can be designed as multi-step recipes with different gas chemistries and power levels, enabling sequential etching of different layers (e.g., oxide on nitride on silicon) without breaking vacuum, provided the reactor is optimized for such sequences.
RIE operates at low pressures, typically in the millitorr range. Lower pressures favor ion bombardment and anisotropic etching, while higher pressures increase chemical reaction rates and can lead to more isotropic profiles. The exact range depends on the specific reactor and process requirements.
The following facts about the NE 950 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NE 950 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the NE 950 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NE 950 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NE 950 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the NE 950 are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 7, 2026.
The Applied Materials 0010-47763 is an electrostatic chuck (ESC) assembly used in semiconductor etching processes.
The Applied Materials 0010-16392 is an electrostatic chuck assembly designed for 300 mm wafer processing, featuring a dual electrode configuration.
Oxford Instruments 100 ICP Fluorine is an inductively coupled plasma etcher for fluorine-based etching, supporting cryo DRIE and multiple etch gases including SF6 and C4F8.