Accretech
The Accretech / TSK UF 200 Automatic Wafer Prober is an automatic wafer prober. The Accretech / TSK UF 200 supports 8-inch wafer sizes. The Accretech / TSK UF 200 is used for wafer testing and probing applications.[1][2][3]

An automatic wafer prober holds the wafer on a vacuum chuck and moves it to align each die with the probe card needles. The probe card is planar and contains many fine needles that contact all bond pads of a single die simultaneously. The system then steps to the next die and repeats the process.
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The following facts about the UF 200 Automatic Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UF 200 Automatic Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UF 200 Automatic Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UF 200 Automatic Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the UF 200 Automatic Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the UF 200 Automatic Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.
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