Teradyne
A 585
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedThe Teradyne A 585 operates as an automatic test system that applies electrical stimuli to a device under test and measures the resulting responses. The system architecture typically includes a test head that interfaces with a wafer prober or package handler, a mainframe containing pattern generation and pin electronics, and a control computer for test program execution. The tester compares measured responses against expected values to determine pass or fail status for each device.
Where it fits in the process flow
General reference — not yet source-verifiedThe Teradyne A 585 is used in the semiconductor manufacturing process after wafer fabrication and before final packaging, in a step known as wafer sort or probe test. In this step, the tester works with a prober to test individual die on a wafer while still in wafer form. The A 585 can also be used for final test after devices are packaged, where it interfaces with a handler to test finished components.
Applications
General reference — not yet source-verifiedThe Teradyne A 585 is applied to parametric and functional testing of semiconductor devices, including digital logic, memory, and mixed-signal circuits. The system is suited for both engineering characterization and high-volume production testing environments.
What do the numbers mean?
No specifications recorded yet
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Where are the manuals?
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Not publicly documented
Field notes
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Not publicly documented
The following facts about the A 585 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the A 585 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the A 585 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the A 585 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the A 585 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the A 585 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Equipment inventory listing
- [2]A 585 — Teradyne | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 1, 2026.
