Waferpedia

SUSS MicroTec

PM5

Test & Probe150mmSUSS MicroTec PM5 family
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The SUSS PM5 is an analytical probe system for precise analysis of devices fabricated on wafers and substrates up to 150 mm. The SUSS PM5 can be used for DC and HF measurements and supports failure analysis. The SUSS PM5 allows the use of up to 12 SUSS probe heads at one time.[1][2]

SUSS MicroTec logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

What it is

The SUSS MicroTec PM5 is an analytical probe system for electrical testing of devices on wafers and substrates up to one hundred fifty millimetres in diameter.[1][2][4][3]

The PM5 is used as a probe station for direct contact measurements on wafers, chips, and substrates, and it supports electrical measurement work in characterization and failure analysis.[3][1][2]

How it works

The PM5 can support direct-current and high-frequency measurements, and the probe heads can be used independently for multiple contact points at the same time.[1][3]

Where it fits in the process flow

The PM5 is suitable for failure analysis and device evaluation on wafers, chips, and substrates before any package-level assembly.[1][3][2]

Applications

The PM5 is used for electrical characterization of fabricated devices on wafers and substrates.[1][2][3]

The PM5 is used for DC measurements, high-frequency measurements, and failure analysis, and it can also support manipulator-based placement of nanowires onto a device or substrate.[1][2][3]

  • precise analysis of devices fabricated on wafers and substrates
  • DC measurements
  • HF measurements
  • failure analysis
  • nanowire pick-and-place onto a device or substrate

What do the numbers mean?

Wafer handling3

wafer/substrate diameter
up to 150 mm (6″)[1]
Accurate?
manipulator probe function
nanowires may be picked and placed onto a device or substrate[1]
Accurate?
Wafer/substrate diameter
up to 150 mm (6 in)[1]
Accurate?

Configuration & options10

system type
analytical probe system[1]2 sources
Accurate?
measurement modes
DC and HF measurements[1]2 sources
Accurate?
failure analysis use
suitable as a failure analysis tool[1]
Accurate?
probe heads
up to 12 SUSS probe heads at one time[1]
Accurate?
Measurement types
DC and HF[1]
Accurate?
Max probe heads
up to 12 SUSS probe heads[1]
Accurate?
Manipulator probe
for nanowire pick-and-place[1]
Accurate?
Failure analysis
suitable as a failure analysis tool[1]
Accurate?
Max probe heads
up to 12 SUSS probe heads at one time[1]
Accurate?
Contact points
up to 4 contact points can be operated independently at the same time[3]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What kind of measurements are performed on this class of machine?General reference — not yet source-verified

Such systems support electrical characterization, continuity checks, parametric testing, and other wafer-level measurements performed through temporary probe contact.

Why is optical viewing used on probe stations?General reference — not yet source-verified

Optical viewing helps the operator or control system locate alignment marks and target pads so the probe tips can be positioned accurately.

Not publicly documented

The following facts about the PM5 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PM5 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the PM5 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the PM5 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the PM5 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the PM5 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]uwaterloo.ca — uwaterloo.cauwaterloo.ca
  2. [2]PM5 — SUSS MicroTec | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
  3. [3]polifab.polimi.it — polifab.polimi.itpolifab.polimi.it
  4. [4]SUSS MicroTec PM5 family | Waferpedia — waferpedia.comwaferpedia.com
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Last updated Oct 5, 2026.

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