NS 8040 SH High Speed

The Seiko Epson NS 8040 SH is a high speed handler used in semiconductor test and probe operations. The handler operates on 200-240 VAC single-phase power at 50/60 Hz.^[2][1]

A handler automatically positions semiconductor devices—either singulated packaged parts or devices still on a wafer—into a test socket that connects to an automated test equipment system. After test results are evaluated, the handler sorts each device into a designated bin based on pass, fail, or grade. The high-speed designation indicates that the machine is optimized for rapid indexing and short test-site dwell times to maximize throughput.

Handlers are used at the final test stage of semiconductor manufacturing, after wafer probe and assembly. The handler interfaces with a tester to perform parametric and functional testing on packaged devices, then sorts them into output bins for downstream packaging, marking, or shipping. In some configurations, handlers can also be used for wafer-level burn-in or test.

High-speed handlers are employed for testing a wide range of semiconductor devices, including memory chips, logic devices, microcontrollers, and analog integrated circuits. The machine is suited to high-volume production environments where fast test times and reliable sortation are critical.