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Perkin Elmer

NexION 300 X ICP-MS

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This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

NexION 300 X ICP-MS — Inventory photo
Fig. 01NexION 300 X ICP-MSInventory photo[1]

What it is

The Perkin Elmer NexION 300 X ICP-MS is an inductively coupled plasma mass spectrometer.[1]

How it works

General reference — not yet source-verified

An ICP-MS uses inductively coupled plasma to turn a sample into ions and a mass spectrometer to measure those ions by mass-to-charge ratio.

The instrument class is used for trace elemental analysis and elemental characterization of liquid or digested samples.

Where it fits in the process flow

General reference — not yet source-verified

An ICP-MS is typically used in analytical and metrology workflows rather than in wafer fabrication process steps.

The instrument usually supports incoming material checks, contamination studies, process monitoring, and failure analysis for materials and samples taken from production.

Applications

General reference — not yet source-verified

The instrument class is used for elemental analysis, impurity screening, and trace metal measurement.

What do the numbers mean?

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Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the NexION 300 X ICP-MS are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No specifications for the NexION 300 X ICP-MS are on record.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NexION 300 X ICP-MS are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the NexION 300 X ICP-MS are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the NexION 300 X ICP-MS are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the NexION 300 X ICP-MS are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]Inventory photo
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Last updated Oct 7, 2026.

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