Nikon
Optiphot 200
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedOptical inspection microscopes operate by focusing visible light onto the sample surface and collecting the reflected or transmitted light through a series of objective lenses to create a magnified image for the operator.
Common illumination techniques available on such microscopes include brightfield, darkfield, and differential interference contrast, which enhance the visibility of different types of surface features.
Where it fits in the process flow
General reference — not yet source-verifiedInspection microscopes are used throughout the semiconductor fabrication process for in-line quality control and off-line failure analysis.
Typical steps where an inspection microscope is applied include after photolithography to check pattern fidelity, after etching to examine sidewall profiles, and after deposition to detect particles or pinholes.
Applications
General reference — not yet source-verifiedThe Nikon Optiphot 200 is applied in wafer inspection for defect detection, critical dimension verification, and overlay alignment checks.
Additional applications include examining thin films, solder bumps, and micro-electromechanical system (MEMS) components where high-resolution optical inspection is required.
What do the numbers mean?
What replaced it?
Related models
- siblingLeica DM8000— Listed on the same microscopes pagesource[3]
- siblingNikon Optiphot150— Listed alongside Optiphot 150 in the same microscope tables.source[3]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Optiphot 200 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Optiphot 200 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Optiphot 200 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Optiphot 200 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Optiphot 200 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Optiphot 200 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Last updated Sep 30, 2026.
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