Micromanipulator
LAS 400 BAA 61
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedA probe station class tool brings probe needles or probing hardware into controlled contact with device pads or features so measurements can be taken without full packaging.
A laser prober class tool combines probing with optical or laser-based access to the device under test so electrical or optoelectronic measurements can be made at defined locations.
Where it fits in the process flow
General reference — not yet source-verifiedThe LAS 400 BAA 61 fits in electrical characterization and debug work at the wafer or die level.
A tool in this class is typically used after wafer processing steps have created the device structures and before final packaging or broader system integration.
Applications
General reference — not yet source-verifiedA tool of this class is used for wafer-level device measurement, electrical probing, and device characterization.
What do the numbers mean?
Optics & imaging1
Configuration & options3
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the LAS 400 BAA 61 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the LAS 400 BAA 61 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the LAS 400 BAA 61 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the LAS 400 BAA 61 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the LAS 400 BAA 61 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the LAS 400 BAA 61 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Sep 29, 2026.
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