KLA
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The KLA Zeta 20 3D is a 3D laser microscope. The KLA Zeta 20 3D is a fully integrated microscope-based system that provides 3D imaging and metrology capability. The KLA Zeta 20 3D software can be used to ascertain dimensional and roughness information.[1]
The Zeta 20 3D is a fully integrated microscope-based system for three-dimensional imaging and metrology.[1]
The Zeta 20 3D scans a sample through a user-specified vertical range and records the XY location and precise Z height of pixels at each position.[1]
The Zeta 20 3D uses that height information to form a true-color three-dimensional image and a two-dimensional composite image.[1]
The Zeta 20 3D uses a CCD camera, a Zeta optics module, a precision Z-drive mechanism, a control box, a substrate holder, and a computer system with imaging and analysis software.[1]
The Zeta 20 3D fits in inspection and metrology workflows where surface topography, step height, roughness, and lateral dimensions must be measured on prepared samples.[1]
The Zeta 20 3D is used after a sample is placed on the stage and focused for a scan, and it produces measurement data for analysis rather than altering the wafer or specimen.[1]
Documented failure modes, common issues, and field considerations.
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The Zeta 20 3D measures step height, roughness, waviness, and lateral dimensions.[1]
The Zeta 20 3D produces a true-color three-dimensional image and a two-dimensional composite image.[1]
The Zeta 20 3D has an optional film thickness module for calculating transparent layer thicknesses on a surface.[1]
The Zeta 20 3D can image surfaces with very low reflectivity and very high roughness.[1]
The following facts about the Zeta 20 3D are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Zeta 20 3D are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Zeta 20 3D are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Zeta 20 3D are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the Zeta 20 3D is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Zeta 20 3D are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 6, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.