KLA
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The KLA Ergolux is a metrology and inspection microscope system, marketed under the combined KLA / Leica brand.[1]
As an optical microscope-based inspection tool, the Ergolux uses visible-light microscopy to let operators and automated systems inspect wafer surfaces for defects, features, and process artifacts.
In a semiconductor fab or lab, the Ergolux is used after key process steps such as photolithography, etch, or deposition to visually verify pattern quality and detect gross defects.
Typical applications include routine wafer inspection, mask and reticle review, and general metrology in development, pilot-line, or low-volume production environments.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Ergolux IM 11 | — | — | — | waferpedia.com[3] |
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The KLA Ergolux is a metrology and inspection microscope system, marketed under the combined KLA / Leica brand.[1]
The following facts about the Ergolux are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ergolux are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Ergolux are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ergolux are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ergolux is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Ergolux are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 1, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.