KLA
2367 Brightfield
What it is
How it works
General reference — not yet source-verifiedBrightfield inspection systems examine wafers by illuminating the surface and detecting contrast from defects against the surrounding pattern or film structure.
Metrology and inspection tools in this class support inline process control by measuring or detecting surface features on wafers rather than modifying the wafers.
Where it fits in the process flow
General reference — not yet source-verifiedThe KLA 2367 Brightfield fits in semiconductor inspection and metrology flows where wafers are checked for surface defects after process steps that can introduce particles, pattern issues, or film anomalies.
Applications
What do the numbers mean?
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Power Requirements208 V, 16 A, 50 / 60 Hz, 3 Phase[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 2367 Brightfield are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 2367 Brightfield are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 2367 Brightfield are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 2367 Brightfield are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 2367 Brightfield are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 2367 Brightfield is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]2367 - Products - Precise System Ltd. — precise-sys.comprecise-sys.com
- [4]KLA 2367 Brightfield wafer defect inspection system for sale — fabsurplus.comfabsurplus.com
Last updated Oct 4, 2026.
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