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Hitachi

S 5000 FE-SEM

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Hitachi S 5000 FE-SEM is a field emission scanning electron microscope. The Hitachi S 5000 FE-SEM is categorized under Metrology & Inspection. The Hitachi S 5000 FE-SEM is specified with ultra high resolution, a 30 kV accelerating voltage, and 500,000x magnification.[1][2][3]

Hitachi logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

Power

30 kV[3]

Vacuum

Airlock type with prepumping[3]

Optics

500,000x[3]

What it is

The Hitachi S 5000 FE-SEM is a field emission scanning electron microscope that uses a cold field emission source. The instrument operates at accelerating voltages from 0.5 kV to 30 kV and provides magnifications up to 800,000 times in high-mag mode.[3]

How it works

The Hitachi S 5000 FE-SEM uses a cold field emission source and a three-stage electromagnetic lens system. The instrument has an octapole electromagnetic stigmator and a two-stage electromagnetic scanning coil.[3]

Applications

General reference — not yet source-verified

FE-SEMs are applied in semiconductor process development, failure analysis, and quality control. The instruments provide high-resolution imaging of surface morphology and can be equipped with detectors for compositional analysis.

What do the numbers mean?

Power & electrical4

Accelerating voltage
30 kV[3]
Accurate?
Accelerating voltage range
0.5 to 30 kV in 0.1 kV steps[3]
Accurate?
Standard equipment
Column, display unit, power supply, S-5080 camera, air compressor, rotary pumps, standard tool, spares and consumables, instruction manual, auto transformer[3]
Accurate?
Dimensions and weight - power supply
54(w) x 63(d) x 150(h) cm; 215 kg[3]
Accurate?

Vacuum & pumping3

Specimen exchange
Airlock type with prepumping[3]
Accurate?
Vacuum pumps
IP1 60 l/s; IP2 20 l/s; IP3 20 l/s; TMP 340 l/s; RP 140 l/min (168 l/min) x 2 sets[3]
Accurate?
Dimensions and weight - rotary pump
54(w) x 22(d) x 41(h) cm; 32 kg x 2 sets[3]
Accurate?

Optics & imaging3

Magnification
500,000x[3]
Accurate?
Performance image resolution
0.6 nm at 30 kV; 3.5 nm at 1 kV in secondary electron image[3]
Accurate?
Dimensions and weight - column
89(w) x 103(d) x 160(h) cm; 385 kg[3]
Accurate?

Dimensions & facilities3

Dimensions and weight - display
110(w) x 90(d) x 116(h) cm; 235 kg[3]
Accurate?
Dimensions and weight - air compressor
40(w) x 23(d) x 55(h) cm; 18 kg[3]
Accurate?
Dimensions and weight - auto transformer
33(w) x 35(d) x 38(h) cm; 72 kg[3]
Accurate?

Configuration & options4

Tool type
Field Emission Scanning Electron Microscope (FE-SEM)[1]
Accurate?
Electron gun
Cold field emission source[3]
Accurate?
Specimen stage motion
X ±3.5 mm continuous; Y ±2 mm continuous; tilt ±40 degrees continuous[3]
Accurate?
Specimen size
9.5 mm x 5 mm x 2.4 mm for standard holder; 20 mm x 6 mm x 2.4 mm maximum for larger specimen holder[3]
Accurate?

Vintage & configurations

  1. 1998Vintage stated[3]

    A source lists the unit as 1998 vintage.

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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Accelerating voltage30 kV[3]
  • Accelerating voltage range0.5 to 30 kV in 0.1 kV steps[3]
  • Specimen exchangeAirlock type with prepumping[3]
  • Vacuum pumpsIP1 60 l/s; IP2 20 l/s; IP3 20 l/s; TMP 340 l/s; RP 140 l/min (168 l/min) x 2 sets[3]
  • Standard equipmentColumn, display unit, power supply, S-5080 camera, air compressor, rotary pumps, standard tool, spares and consumables, instruction manual, auto transformer[3]
  • Dimensions and weight - power supply54(w) x 63(d) x 150(h) cm; 215 kg[3]
  • Dimensions and weight - rotary pump54(w) x 22(d) x 41(h) cm; 32 kg x 2 sets[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What is the resolution of the Hitachi S 5000 FE-SEM at 30 kV?

0.6 nm at 30 kV in secondary electron image.[3]

What type of electron gun does the S 5000 FE-SEM use?

A cold field emission source.[3]

What is the maximum magnification of the S 5000 FE-SEM?

800,000 times in high-mag mode (x250 to x800,000).[3]

What specimen size can the standard holder of the S 5000 FE-SEM accommodate?

9.5 mm by 5 mm by 2.4 mm (height).[3]

Not publicly documented

The following facts about the S 5000 FE-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented variants, configuration options, or revision breakpoints of the S 5000 FE-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 5000 FE-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S 5000 FE-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S 5000 FE-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the S 5000 FE-SEM are on record.

    Answerable by: an OEM parts catalog or a service engineer

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]S 5000 FE-SEM — Hitachi | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
  3. [3]semistarcorp.com — semistarcorp.comsemistarcorp.com
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Last updated Sep 24, 2026.

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