Cascade Microtech
S 300
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Cascade Microtech S 300 is a probe station used for testing semiconductor devices. The S 300 can be configured with a Temptronic TP03000 ThermoChuck system for temperature-controlled probing. The S 300 can include an Agilent 34980 A multifunction switch/measure unit and an Agilent 86100 A oscilloscope.[1]
What it is
How it works
General reference — not yet source-verifiedIn a probe station, a wafer is placed on a chuck that can be moved in multiple axes. Probe needles are aligned to the device contact pads using a microscope and micro-positioners. The needles are connected to test instrumentation that applies signals and measures responses.
Applications
General reference — not yet source-verifiedThe Cascade Microtech S 300 is used for DC and low-frequency parametric testing of semiconductor devices. Applications include transistor characterization, resistance and capacitance measurement, and leakage current testing.
What do the numbers mean?
Control & software2
- Temptronic TP 03000 A 2300 2 ThermoChuck System & Control Unit[1]
Configuration & options8
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the S 300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 300 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the S 300 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the S 300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the S 300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the S 300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]Equipment inventory listing
Last updated Oct 2, 2026.
