Comparison ledger
Electroglas EG 4090, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4090Electroglas | 1007KLA |
|---|---|---|
| OEM | Electroglas | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4090 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | with Agilent 4071[2] | — |
| Equipment type | PCM Tester[2] | Prober[4] |
| Associated wafer size | 200 mm[1] | — |
| Probe family description | Thin wafer probers[1] | — |
| Stated performance focus | Fast probing for high throughput of small die[1] | — |
| Related instrument | Agilent 4071[2] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
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