Comparison ledger
Bruker D 8 Advance, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | D 8 AdvanceBruker | |
|---|---|---|
| OEM | Bruker | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker D 8 Advance | KLA 0035235-003 MMD Head |
| Cited variants | — | |
| Specifications | ||
| Configuration | 2 circle diffractometer with Lynxeye detector and scintillation detector[2] | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Instrument type | X-ray diffractometer[3] | — |
| Applications | XRD, PDF, SAXS, and WAXS[3] | — |
| Goniometer | Two-circle goniometer[2] | — |
| Detector configuration | Lynxeye detector and scintillation detector[2] | — |
| Temperature stage | Bruker high temperature stage[2] | — |
| Platform | XRD, PDF, SAXS, and WAXS[3] | — |
| Beam geometries | Automatic, motorized switching between 4 different beam geometries[3] | — |
| Sample types | Liquids, loose powders, thin films, and solid blocks[3] | — |
| Model | — | 0035235-003[4] |
| Make | — | KLA[4] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[4] |
| Compatible System | — | KLA AIT-XP[4] |
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