Comparison ledger
Applied Materials 0010-03254 E Chuck, Keysight 4155 C Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Keysight 4155 C Semiconductor Parameter Analyzer |
| Cited variants | — |
|
| Specifications | ||
| Manufacturer | — | Keysight / Agilent[2] |
| Model | — | 4155 C[2] |
| Instrument type | — | Semiconductor Parameter Analyzer[2] |
| Included software | — | Desktop EasyEXPERT standard edition[1] |
| Measurement functions | — | dc or pulsed force/measure, stress force, voltage/current sweep, sampling (time domain), and C-V measurement[1] |
| Maximum number of sampling points | — | 10,001 (linear)[1] |
| Maximum number of VAR1 sweep steps | — | 1001[1] |