Test Research
Inc (TRI) TR 7700 QM SII AOI alternatives
Comparable Metrology & Inspection equipment documented in the Waferpedia catalog.
6 comparable tools
KLA
INS 3000 Macro Defect
Metrology & Inspection
The INS 3000 Macro Defect is an inspection system in the metrology and inspection category, used for automated optical detection of surface-level macro defects on semiconductor wafers.
KLA
.204 PSL Wafer
Metrology & Inspection
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA
.496 PSL Wafer
Metrology & Inspection
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
KLA
.498 PSL Wafer
Metrology & Inspection
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
Applied Materials
0010-18024 Pyrometer Assembly
Metrology & Inspection
KLA
0035235-003 MMD Head
Metrology & Inspection
The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD compatible with the KLA AIT-XP.
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