Teradyne
J 750 EX alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 Smart Scale
Test & Probe
The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
Advantest
93000 SOC
Test & Probe
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
LTX-Credence
ASL 1000
Test & Probe
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
LTX-Credence
ASL 3000
Test & Probe
The LTX / Credence ASL 3000 is a semiconductor tester with a computer configuration including a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
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