Comparison ledger
Tektronix 11401 Oscilloscope, Yxlon Multiplex 5500 M Material, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11401 OscilloscopeTektronix | |
|---|---|---|
| OEM | Tektronix | Yxlon |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix 11401 Oscilloscope | Yxlon Multiplex 5500 M Material |
| Specifications | ||
| OEM | — | Yxlon[1] |
| Model | — | Multiplex 5500 M Material[1] |
| Category | — | Test & Probe[1] |
| Equipment type | — | material tester[1] |
| Vintage | — | 2007[1] |
| Description | — | X-ray inspection system[2] |
| Product description | — | X-ray inspection system[2] |
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