Waferpedia

Comparison ledger

Archer 10 XT Overlayversussem2

KLA Archer 10 XT Overlay, Zeiss sem2, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
sem2Zeiss
OEMKLAZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size200mm200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA ArcherZeiss sem2
Specifications
ConfigurationDuring refurbishment the loadports were replaced with the cassette loader that is shown in our video below[1]—
Wafer size200mm dual port open wafer handler[1]200 mm[3]
OEMKLA[2]Zeiss[3]
ModelArcher 10 XT Overlay[2]sem2[3]
CategoryMetrology & Inspection[2]Metrology & Inspection[3]
Description200mm overlay metrology system[2]—
Software version5.6[1]—
Wafer handler200mm dual port open wafer handler[1]—
Chuck8" chuck[1]—
Computer upgradeXP computer upgrade[1]—
ComputerKLASS RS2 computer[1]—
Equipment name—Zeiss 200 mm Scanning Electron Microscope[3]
Equipment type—Scanning Electron Microscope[3]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]nanolab.berkeley.edunanolab.berkeley.edu