Comparison ledger
KLA 4PP-TypeF, Tektronix 11401 Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 4PP-TypeFKLA | 11401 OscilloscopeTektronix |
|---|---|---|
| OEM | KLA | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 4PP-TypeF | — |
| Specifications | ||
| Model | 4PP-TypeF[1] | — |
| Probe spacing | 0.625mm[2] | — |
| Tip radius | 40um[2] | — |
| Force | 100gm[2] | — |
| Material | 230-0918[3] | — |
| Application | Metal measurement[2] | — |
| Compatible systems | Filmetrics R50 / R54[3] | — |
| Probe type | 4PP probe[2] | — |
| Spacing | 0.625 mm[2] | — |
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