Comparison ledger
KLA .498 PSL Wafer, Thermo Fisher Scientific FEI Nova NanoSEM 430 FE-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Scientific FEI Nova NanoSEM 430 FE-SEMThermo Fisher | |
|---|---|---|
| OEM | KLA | Thermo Fisher |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Thermo Fisher Scientific FEI Nova NanoSEM |
| Specifications | ||
| Configuration | NIST Traceable[1] | 210-240 V[2] |
| NIST traceability | Yes[1] | — |
| Equipment type | — | Field Emission Scanning Electron Microscope (FE-SEM)[3] |
| Category | — | Metrology & Inspection[3] |
| Manufacturer | — | Thermo Fisher Scientific / FEI[3] |
| Model | — | Nova NanoSEM 430[3] |
| Supply voltage | — | 210-240 V[3] |
| Supply frequency | — | 50/60 Hz[3] |
| Supply current | — | 15 A[3] |
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