Comparison ledger
KLA 1007, Teradyne A500, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | A500Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | Teradyne |
| Introduced | — | 1987 |
| Production run | — | 1987– |
| Lifecycle | — | Legacy |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne A500 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Function | — | Analog VLSI test system[3] |
| Application | — | Testing integrated devices that provided the interface between analog and digital data[3] |
| Type | — | Analog VLSI test system[3] |
| Introduction year | — | 1987[3] |
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