Waferpedia

Comparison ledger

1034versusS-302-4

Electroglas 1034, Signatone S-302-4, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1034Electroglas
S-302-4Signatone
OEMElectroglasSignatone
CategoryTest & ProbeTest & Probe
Wafer size—100mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyElectroglas 1034Signatone S-302-4
Specifications
Type—Four Point Resistivity Probe Station[1]
Probe stand—100 mm[1]
Probe head—4 point probe head with 5 mil radius tips of 40 mil spacing[1]
Measurement use—Sheet resistance and resistivity measurements of substrates and thin films[1]
Interfaces with—Keithley 2450[1]
Probe stand size—100 mm[1]
Measurement capabilities—Sheet resistance and resistivity measurements of substrates and thin films[1]
Interfaces—Keithley 2450[1]

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Sources (1)Every fact above is drawn from these public sources
  1. [1]smif.pratt.duke.edusmif.pratt.duke.edu