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Comparison ledger

Medalist i 5000 ICTversus11000

Agilent Medalist i 5000 ICT, Cascade Microtech 11000, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
11000Cascade Microtech
OEMAgilentCascade Microtech
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAgilent Medalist i 5000 ICTCascade Microtech 11000
Specifications
Test HeadN 1141 A[1]—
ConfigATO 46121[1]—
Test Head AssemblyN1145 A[1]—
2 x Ctl_Xtp control cardsthroughput multiplier capable[1]—
64 MB RAM per moduleprobe location and debug of Module 3[1]—
8 programmable channels2 x Agilent 6624, four channels in each Modul 3 & 3[1]—
Frequency50 Hz (configured for European mains)[1]—
No board handlerstandalone system, manual board load[1]—
ArchitectureUn-multiplexed, tester per pin, 1:1 channel to node[1]—
Board Configuration18 x Unmex_H 144 Channel hybrid pin cards: 2,592 un-multiplexed nodes[1]—
Analogue Stimulus/Response2 x ASRU_C analogue stimulus/response units, one per module[1]—
Control Cards2 x Ctl_Xtp control cards: throughput multiplier capable[1]—
Memory64 MB RAM per module[1]—
Power Supplies8 programmable channels: 2 x Agilent 6624, four channels in each module[1]—
Mains Frequency50 Hz (configured for European mains)[1]—
ConfigurationNo board handler: standalone system, manual board load[1]With antivibration table[2]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]inventory listing