Comparison ledger
Agilent 11980 A, Wyko HD8000, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | HD8000Wyko |
|---|---|---|
| OEM | Agilent | Wyko |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Wyko HD8000 |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| Instrument type | — | non-contact optical profiler[2] |
| Application | — | characterizes magnetic thin-film heads[2] |
| Measurement | — | pole-tip recession (PTR) or ABS flatness[2] |
| Measurement time | — | less than 3 seconds[2] |
| Combined PTR and ABS flatness measurement time | — | under 5 seconds[2] |
| Gauge P/T | — | better than 10%[2] |
| Software | — | Wyko Vision32 analysis software[2] |
| Network integration | — | communicates with yield management networks[2] |
| Type | — | Magnetic Head Profiling System[2] |
| Measurement method | — | Non-contact optical profiler[2] |
| Measured parameters | — | Pole-tip recession (PTR) or ABS flatness[2] |
| Production use | — | 100% in-line testing[2] |
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