Comparison ledger
Agilent 11980 A, CyberOptics SE600 SPI, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | SE600 SPICyberOptics |
|---|---|---|
| OEM | Agilent | CyberOptics |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | CyberOptics SE600 SPI |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| DOM | — | May 2016[2] |
| Inspection Type | — | Automated Optical Inspection (AOI)[2] |
| Application | — | SMT PCB Inspection[2] |
| Frequency | — | 50/60 Hz[2] |
| Phase | — | Single Phase[2] |
| Manufacturer | — | CyberOptics[2] |
| Model | — | SE600 SPI[2] |
| Year | — | 2016[2] |
| Operating Voltage | — | 100-120 VAC, 15A / 220-240 VAC, 10A[2] |
| Status | — | Fully Functional[2] |
| Product Description | — | 3D inline SPI system[3] |
| Resolution | — | 15 µm / 30 µm (selectable)[3] |
| Maximum PCB Size | — | 510 × 510 mm (20 × 20 in.)[3] |
| Minimum PCB Size | — | 50 × 50 mm[3] |
| Height Accuracy | — | 2 µm (certification target)[3] |
| Gage R&R | — | <<2% (cert. target); <<5% (PCB)[3] |
| Peak Throughput | — | 108 cm²/sec (30 µm); 56 cm²/sec (15 µm)[3] |
| No Field Calibration | — | Yes[3] |
| Voltage | — | 100-120 VAC, 15A / 220-240 VAC, 10A[2] |
| Product Type | — | High-Performance 3D SPI[3] |
| PCB Size Max. | — | 510×510 mm (20×20 in.)[3] |
| PCB Size Min. | — | 50×50 mm[3] |
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