Comparison ledger
Advantest T 5375, Tektronix 11401 Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5375Advantest | 11401 OscilloscopeTektronix |
|---|---|---|
| OEM | Advantest | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5375 | — |
| Cited variants | — | |
| Specifications | ||
| Configuration | Dual TH[1] | — |
| Wafer support | 300mm[4] | — |
| Maximum test frequency | 143MHz / 286MHz (DDR mode)[4] | — |
| Device types | DRAM, SDRAM, DDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, Mask ROM[4] | — |
| Maximum devices per system | 256[4] | — |
| Test channels | Maximum 256 per system (with 8/9 bit mode)[4] | — |
| Test heads | Maximum 2 stations[4] | — |
| Fan-out per station | Up to 128 parallel devices per station[4] | — |
| Maximum speed (MHz) | 143 MHz[4] | — |
| DDR mode speed | 286 MHz[4] | — |
| Test Rate | 143 MHz (286 MHz in DDR mode)[4] | — |
| Maximum Devices Tested (Front-end DRAM) | 256 per system[4] | — |
| Supported Wafer Size | 300 mm[4] | — |
| Number of Test Stations | 2 (max)[4] | — |
| DC Test Units per Station | 64 (max)[4] | — |
| Programmable Power Supplies per Station | 256 (max)[4] | — |
| Options | MRA4 or AFM[4] | — |
| Supported Device Types (explicitly listed) | DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, Mask ROM[4] | — |
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